KI-3020D is designed to create a digital curve for testing 2-pin / 3-pin semiconductor devices, such as Diodes, NPN/PNP Transistors, FET, IGBT, UJT, SCR, TRIAC, etc... All results are displayed on built-in TFT LCD screen without additional oscilloscope or PC. It also provides the touchscreen for intuitive manipulation: simply touch screen buttons to set up desired measuring conditions, including device type, voltage bias, or current steps, etc...
Two sets of the testing socket are available for users to switch between two devices for rapid test and comparison. All captured data can be displayed on LCD screen and saved in PC.

• KI-3020D 數位化半導體曲線描跡器
• KI-3020D Demo Video

Curve tracing on a scope could be made easily by KI-3020A However, only a Sync. Oscilloscope is required. Characteristic curves of all types of semiconductor-transistor such as FET, diodes, zener diode, SCR, TRIAC, DIAC, UJT etc, are accurately displayed. By examining these curves you can determine all of the operating characteristics of the device you are testing including gain (β), cutoff current, leakage current, output admittance and any other measurable specifications. It is far superior to the general transistor tester for checking quality. Uniquely, it is intended for testing semiconductors in production line and lab as well as making troubleshooting by technicians.

• KI-3020A 半導體曲線描跡器

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